Probe Station (MI-WPT6)

Probe Station (MI-WPT6)

Product Details:

  • Product Type Probe Station (MI-WPT6)
  • Color Black
  • Usage Laboratory
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Probe Station (MI-WPT6) Price And Quantity

  • 1 Piece

Probe Station (MI-WPT6) Product Specifications

  • Probe Station (MI-WPT6)
  • Black
  • Laboratory

Probe Station (MI-WPT6) Trade Information

  • 5 Piece Per Day
  • 6-8 Days
  • All India

Product Description


The Probe System is able to support the following on-wafer measurement setup:
. I-V/C-V (DC to 10MHz) and pulsed I-V.
. DC/RF Probe card measurement setup.
. The chuck is RF compatible.
. Measurements of current at pA levels with shielding box (shielding box is not a part of the probe station).
. Measurement of the capacitance of the order of fF level.
. Possibility of future upgradable to RF measurements up to 10 GHz.

 Probe System Integration:

. The system is able to integrate with any instrument brand and type for all device measurement test setups.
. The system is able to integrate with the existing Keithley 4200A semiconductor Characterization system
(Semiconductor Characterization System is not a part of the probe station).

Mechanical Performance Specification of Prober.
. Chuck Stage Movement: Manual
. Chuck X-Y Stage: Independent X and Y Axis control
. X-Y stage travel range: 100mm (X axis); 100mm (Y axis)
. Chuck Z Stage measurement sub-systems: Optimized Z Stage movement to keep the device under test (DUT) in 
focus during probing. 

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