Optimized for I-V, C-V measurements of device and wafer characterization tests, Failure analysis, sub- micro probing MEMS, optoelectronics engineering test and more.
Stable Platen mounted with up to 6 micro positioners facility.
Solid station frame with built-in vibration-isolations.
Option for High Resolution top side microscope.
Quick and ergonomic sample change.
Specification
XY Theta Chuck: 1 Nos.
Micro positioners : 4Nos.
Microscope : Stereo Zoom , Microscope System With Boom Stand(1Nos)